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Growth dynamics of reactive-sputtering-deposited AlN filmsmore_vert
Growth dynamics of reactive-sputtering-deposited AlN filmsclose

Growth dynamics of reactive-sputtering-deposited AlN films

tipo de documento Publicacion

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Etiquetas: buffer layers, acoustic-wave devices, microscop, aluminum nitride films, x-ray reflectivity, chemical-vapor-deposition, surface-roughness, instability

Intrinsic anomalous surface roughening of TiN films deposited by reactive sputteringmore_vert
Intrinsic anomalous surface roughening of TiN films deposited by reactive sputteringclose

Intrinsic anomalous surface roughening of TiN films deposited by reactive sputtering

tipo de documento Publicacion

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Etiquetas: si, cu, chemical-vapor-deposition, x-ray reflectivity, density, growth, instability, interfaces, roughness, microstructure

Pseudospectral versus finite-difference schemes in the numerical integration of stochastic models of surface growthmore_vert
Pseudospectral versus finite-difference schemes in the numerical integration of stochastic models of surface growthclose

Pseudospectral versus finite-difference schemes in the numerical integration of stochastic models of surface growth

tipo de documento Publicacion

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Etiquetas: universality, kinetic-growth, scale-invariance, parisi-zhang equation, instability, continuum, diffusion, relaxation, interfaces