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Artículo

Pattern-wavelength coarsening from topological dynamics in silicon nanofoams

tipo de documento semantico ckh_publication

Ficheros

IIT-14-020A.pdf
Tamaño 705805
Formato Adobe PDF
Fecha de publicación 07/03/2014
Fuente Revista: Physical Review Letters, Periodo: 1, Volumen: online, Número: 9, Página inicial: 094103.1, Página final: 094103.5
Estado info:eu-repo/semantics/publishedVersion

Resumen

Idioma es-ES
Idioma en-GB
Resumen

We report the experimental observation of a submicron cellular structure on the surface of silicon targets eroded by an ion plasma. Analysis by atomic force microscopy allows us to assess the time evolution and show that the system can be described quantitatively by the convective Cahn-Hilliard equation, found in the study of domain coarsening for a large class of driven systems. The space-filling trait of the ensuing pattern relates it to evolving foams. Through this connection, we are actually able to derive the coarsening law for the pattern wavelength from the nontrivial topological dynamics of the cellular structure. Thus, the study of the topological properties of patterns in nonvariational spatially extended systems emerges as complementary to morphological approaches to their challenging coarsening properties.

Grupos de investigación y líneas temáticas Instituto de Investigación Tecnológica (IIT)
Tipo de archivo application/pdf
Idioma en-GB
Tipo de acceso info:eu-repo/semantics/restrictedAccess
Fecha de modificacion 23/05/2022
Fecha de disponibilidad 15/01/2016
fecha de alta 15/01/2016

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