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True constant temperature measurement system for lifetime tests of metallic interconnections of IC'smore_vert
True constant temperature measurement system for lifetime tests of metallic interconnections of IC'sclose

True constant temperature measurement system for lifetime tests of metallic interconnections of IC's

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Autores: Giannetti, Romano, Ciofi, Carmine, Neri, Bruno

Etiquetas: microcomputers, temperature control., metallization, reliability testing, electromigration